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Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3 (the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3 and r4 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2andn3, the type.

Of interference, the thin-layer thickness L in nanometres, and the wavelength λ in nanometres of the light as measured in air.

Where λ is missing, give the wavelength that is in the visible range.

Where Lis missing, give the second least thickness or the third least thickness as indicated?

Short Answer

Expert verified

The third least thickness is 478.125 nm.

Step by step solution

01

Introduction

Reflection is the process by which electromagnetic radiation is returned either at the boundary between two media (surface reflection) or at the interior of a medium (volume reflection), whereas transmission is the passage of electromagnetic radiation through a medium.

02

Find the third least thickness is

n1=1.55,n2=1.L=2+12612nm21.60=478.125nm60n3=1.33n2>n1n2>n3

We use condition for destructive interference which gives the minimum reflection.

n1=1.55,n2=1.60and n3=1.33

n2>n1 and n2>n3

Wavelength of light λ=612

The condition of minimum reflection or destructive interference is

m+12λ=2n2LL=m+12λ2n2

Where m=0,1,2,......

For third least thickness occurs when m=2

L=2+12612nm21.60=478.125nm

Hence, the third least thickness is478.125nm.

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Most popular questions from this chapter

Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1and r2interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35- 2 refers to the indexes of refraction n1, n2and n3, the type of interference, the thin-layer thickness Lin nanometres, and the wavelength λin nanometres of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Figure 35-46a shows a lens with radius of curvature lying on a flat glass plate and illuminated from above by light with wavelength l. Figure 35-46b (a photograph taken from above the lens) shows that circular interference fringes (known as Newton’s rings) appear, associated with the variable thickness d of the air film between the lens and the plate. Find the radii r of the interference maxima assumingr/R1.

In a double-slit experiment, the fourth-order maximum for a wavelength of 450 nm occurs at an angle of θ=90°. (a) What range of wavelengths in the visible range (400 nm to 700 nm) are not present in the third-order maxima? To eliminate all visible light in the fourth-order maximum, (b) should the slit separation be increased or decreased and (c) what least change is needed?

A thin film of acetone n=1.25coats a thick glass platen=1.50White light is incident normal to the film. In the reflections, fully destructive interference occurs at 600nmand fully constructive interference at700nm. Calculate the thickness of the acetone film.

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