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In the double-slit experiment of Fig. 35-10, the electric fields of the waves arriving at point P are given by

E1=(2.00μV/m)sin[1.26×1015t]E2=(2.00μV/m)sin[1.26×1015t+39.6rad]

Where, timetis in seconds. (a) What is the amplitude of the resultant electric field at point P ? (b) What is the ratio of the intensity IPat point P to the intensity Icenat the center of the interference pattern? (c) Describe where point P is in the interference pattern by giving the maximum or minimum on which it lies, or the maximum and minimum between which it lies. In a phasor diagram of the electric fields, (d) at what rate would the phasors rotate around the origin and (e) what is the angle between the phasors?

Short Answer

Expert verified

(a) The resultant electric field at point P is 2.32μV/m.

(b) The ratio of intensity at point P to intensity at center of interference pattern is 1.35.

(c) The point P is lying between sixth maxima and seventh minima of phasor diagram.

(d) The rate of rotation of phasor is1.26×1015rad/s.

(e) The angle between phasors is 2269°.

Step by step solution

01

Identification of given data

The amplitude of electric field for both waves is 2μV/m,

The phase difference for both waves is ϕ=39.6rador2269°,

The angular frequency of both waves is ω=1.26×1015rad/s,

02

Understanding the concept

The phase difference of fringe pattern varies with the path difference. For minimum phase difference path difference should be minimum and vice versa.

03

(a) Determination of amplitude of resultant electric field at point P

The resultant electric field at point P is given as:

E=2E0cosϕ2

Substitute all the values in equation.

E=2(2μV/m)cos2269°2=2.32μV/m

Therefore, the resultant electric field at point P is 2.32μV/m.

04

(b) Determination of ratio of intensity at point P to intensity at center of interference pattern

The ratio of intensity at point P to intensity at center of interference pattern is given as:

IPIcen=4cos2ϕ2

Substitute all the values in equation.

IPIcen=4cos22269°2IPIcen=1.35

Therefore, the ratio of intensity at point P to intensity at center of interference pattern is 1.35.

05

(c) Determination of position of point P between a maximum and minimum

The phase difference for both waves in terms of wavelength of wave is given as:

ϕλ=ϕ2πλ

Substitute all the values in equation.

ϕλ=39.6rad2πλ=6.3λ

The point P lies between sixth of maximum and seventh of minimum fringe.

Therefore, the point P is lying between sixth maxima and seventh minima of phasor diagram.

06

(d) Determination of rate of rotation of phasors

The rate of rotation of phasor will be equal to the angular frequency of both waves.

The rate of rotation of phasor is given as:

dϕdt=ω

Substitute all the values in the above equation.

dϕdt=1.26×1015rad/s

Therefore, the rate of rotation of phasors is 1.26×1015rad/s.

07

(e) Determination of angle between phasors

The angle between the phasors will be equal to the phase difference between both waves.

The angle between phasors is given as:

θ=ϕ=39.6rad=39.6rad180°π=2269°

Therefore, the angle between phasors is2269°

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Most popular questions from this chapter

In Fig. 35-4, assume that the two light waves, of wavelength 620nm in air, are initially out of phase by π rad. The indexes of refraction of the media are n1=1.45 andn2=1.65 . What are the (a) smallest and (b) second smallest value of Lthat will put the waves exactly in phase once they pass through the two media?

Figure 35-29 shows the transmission of light through a thin film in the air by a perpendicular beam (tilted in the figure for clarity). (a) Did rayr3undergo a phase shift due to reflection? (b) In wavelengths, what is the reflection phase shift for rayr4? (c) If the film thickness is L, what is the path length difference between raysr3andr4?

Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35- 2 refers to the indexes of refraction n1, localid="1663139751503" n2and n3, the type of interference, the thin-layer thickness Lin nanometres, and the wavelength λin nanometres of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1and r2interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35- 2 refers to the indexes of refraction n1, n2andn3, the type of interference, the thin-layer thickness Lin nanometres, and the wavelength λin nanometres of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

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