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In a double-slit experiment, the fourth-order maximum for a wavelength of 450 nm occurs at an angle of θ=90°. (a) What range of wavelengths in the visible range (400 nm to 700 nm) are not present in the third-order maxima? To eliminate all visible light in the fourth-order maximum, (b) should the slit separation be increased or decreased and (c) what least change is needed?

Short Answer

Expert verified

(a) The wavelength from 600nm to 700 nmwill be absent in the visible range.

(b) The slit separation for third order wavelength decreases.

(c) The least change needed in separation is 200nm.

Step by step solution

01

Identification of given data

The wavelength of light is λ4=450nm

The order of fringe for fourth order is m4=4

The angle for the fourth order fringe is θ=90°

The order of fringe for third order is m3=3

The phase difference of fringe pattern varies with the path difference. For minimum phase difference path difference should be minimum and vice versa.

02

Step 2(a): Determination of range of wavelengths not present in third order wavelength

The separation between slits is given as:

dsinθ=m4λ4

Substitute all the values in the above equation.

dsin90°=4450nmd=1800nm

The lowest wavelength absent in visible range is given as:

dsinθ=m3λ3

Substitute all the values in equation.

1800nmsin90°=3λ3λ3=600nm

The wavelength from 600nm to 700 nm will be absent in the visible range.

Therefore, the wavelength from 600nm to 700 nmwill be absent in the visible range.

03

Step 3(b): Whether slit separation increases or decreases

The slit separation varies inversely with wavelength of light. The wavelength of light for third order fringe increases so slit separation for third order wavelength of light decreases.

Therefore, the slit separation for third order wavelength decreases.

04

Step 4(c): Determination of path difference for maximum possible phase difference

The separation for lowest wavelength of visible range is given as:

dlsinθ=m4λl

Here, λl is the lowest wavelength of visible range and its value is 400nm.

Substitute all the values in equation.

dlsin90°=4400nmdl=1600nm

The least change needed is given as:

D=d-dl

Substitute all the values in equation.

D=1800nm-1600nmD=200nm

Therefore, the least change needed in separation is 200nm.

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Most popular questions from this chapter

In the two-slit experiment of Fig.35-10, let angle θbe 20.00C, the slit separation be 4.24μm, and the wavelength be λ=500nm. (a) What multiple of λgives the phase difference between the waves of rays r1and r2when they arrive at point Pon the distant screen? (b) What is the phase difference in radians? (c) Determine where in the interference pattern point P lies by giving the maximum or minimum on which it lies, or the maximum and minimum between which it lies?

Figure 35-25 shows two sources s1 and s2 that emit radio waves of wavelengthλin all directions. The sources are exactly in phase and are separated by a distance equal to 1.5λ . The vertical broken line is the perpendicular bisector of the distance between the sources.

(a) If we start at the indicated start point and travel along path 1, does the interference produce a maximum all along the path, a minimum all along the path, or alternating maxima and minima? Repeat for

(b) path 2 (along an axis through the sources) and

(c) path 3 (along a perpendicular to that axis).

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of and interfere,r3and r4here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

In Fig. 35-37, two radio frequency point sources S1and S2, separated by distance d=2.0m, are radiating in phase with λ=0.50m. A detector moves in a large circular path around the two sources in a plane containing them. How many maxima does it detect?

In Fig, monochromatic light of wavelength diffracts through narrow slit S in an otherwise opaque screen. On the other side, a plane mirror is perpendicular to the screen and a distance h from the slit. A viewing screen A is a distance much greater than h. (Because it sits in a plane through the focal point of the lens, screen A is effectively very distant. The lens plays no other role in the experiment and can otherwise be neglected.) Light travels from the slit directly to A interferes with light from the slit that reflects from the mirror to A. The reflection causes a half-wavelength phase shift. (a) Is the fringe that corresponds to a zero path length difference bright or dark? Find expressions (like Eqs. 35-14 and 35-16) that locate (b) the bright fringes and (c) the dark fringes in the interference pattern. (Hint: Consider the image of S produced by the minor as seen from a point on the viewing screen, and then consider Young’s two-slit interference.)

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