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Describe the mechanism of the production of an LMM Auger electron.

Short Answer

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The sample is first evaporated before being ionized in gas phase sources. In desorption sources, a solid or liquid sample is instantaneously converted into gaseous ions.

Step by step solution

01

MNN Auger Electron 

The mechanism of the production of an MNN Auger electron is based on a two step processes. In the first step, the analyte is exposed to a beam of electrons or X-rays which results in the formation of an electronically excited ion as A+*.

A+ei-A+*+ei'-+eA-

Where, ei-represents an incident electron from the source, ei'-represents the same electron after its interaction with Aand hence has lost some of its energy, and eA-represents an electron which is ejected from one of the orbitals ofA.

02

Advantage of Gaseous and Desorption sources 

The relaxation of the excited ion A+*is followed by the ejection of an Auger electron role="math" localid="1645545316500" e-Awith kinetic energy EKin the second step.

An M electron is removed at the start of the MNN Auger transition. A transition of a Nelectron to the M orbital occurs next, followed by the ejection of a second N electron.

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Compare EELS to conventional IR and Raman spectroscopy. Focus on what is used to excite and detect vibrations. What are the advantages and limitations of EELS?

Name three possible sources of signals with the SEM. Differentiate between elastic and inelastic scattering of electrons.

What are the main advantages of surface photon techniques when compared with electron and ion spectroscopic methods? What are the major disadvantages?

An XPS electron was found to have a kinetic energy of 1055.3eVwhen ejected with an AlKαsource

(λ=0.83393nm)and measured in a spectrometer with a work function of 25.1eV. The electron is believed to be a N(1s)electron in NaNO3.

(a) What was the binding energy for the electron?

(b) What would be the kinetic energy of the electron if a MgKα(λ=0.98900nm)source were used?

(c) How could one be sure that a peak was an XPS and not an Auger electron peak?

(d) At what binding and kinetic energies would a peak for NaNO2be expected when the AlKαsource was used with the same spectrometer?

Quantitative X-ray photo electron spectrometry has become more popular in recent years. The factors relating the intensity of emission to atomic concentration (density) are given in Equation 21-3.

(a) Of the factors influencing the emission intensity, identify those related to the analyte.
(b) Identify the factors influencing the emission intensity related to the spectrometer.

(c) The measured quantity in quantitative XPS is usually I/S, where Iis the peak area andSis the sensitivity factor for the element of interest. If this quantity is measured for the analyte (I/S)aand the corresponding value measured for an internal standard with a different transition (I/S)s, show by means of an equation how the ratio (I/S)a/(I/S)s is related to the atomic concentration ratio of the analyte to the internal standard.
(d) If all the elements on a surface are measured by XPS, show that the fractional atomic concentration fAof element A is given by
fA=IA/SAIn/Sn
where Inis the measured peak area for element n,Snis the atomic sensitivity factor for that peak, and the summation is carried out over all n.

(e) For a polyurethane sample in which carbon, nitrogen, and oxygen were detected by XPS, the sensitivity factor for Cwas 0.25on the spectrometer used. The sensitivity factor for Nwas 0.42and that for Owas 0.66on the same spectrometer. If the peak areas were C(1s)=26,550, N(1s)=4475, and O(1s)=13,222 what were the atomic concentrations of the three elements?
(f) What are the limitations of quantitative analysis with XPS? Why might the atomic concentrations measured not correspond to the bulk composition?
(g) For polyurethane, the stoichiometric atomic concentrations are C=76.0%, N=8.0%, and O=16.0%. Calculate the percentage error in the values obtained in part (e) for each element.

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