Chapter 11: Problem 52
When \(X\) rays of wavelength \(0.090 \mathrm{nm}\) are diffracted by a metallic crystal, the angle of first-order diffraction \((n=1)\) is measured to be \(15.2^{\circ} .\) What is the distance (in pm) between the layers of atoms responsible for the diffraction?
Short Answer
Step by step solution
Key Concepts
These are the key concepts you need to understand to accurately answer the question.
X-ray diffraction
- The process involves the interaction of X-rays with the atomic layers in the crystal.
- The angles and intensities of the diffracted X-rays provide information about the atomic arrangement.
- Analysis of the diffraction pattern helps in defining the dimensions and symmetry of the crystal.
Wavelength measurement
- Shorter wavelengths provide more detailed information about the crystal structure.
- X-rays have very short wavelengths, typically on the order of a few angstroms (1 angstrom = 0.1 nm).
- Accurate wavelength measurement results in precise determination of atomic distances within a crystal.
Crystalline structure
- Crystals differ structurally based on their atomic layout, which can range from cubic to hexagonal arrangements.
- The symmetry and orientation of atoms in a crystal impact the diffraction pattern observed.
- Understanding the crystalline structure aids in developing materials with specific desired properties.
Atomic layer spacing
- Interplanar spacing helps in determining the structure and symmetry of the crystal.
- The precise measurement of this spacing is crucial for material characterization.
- Understanding atomic layer spacing is essential in designing advanced materials and technologies.