Scanning Electron Microscopes (SEM) provide a unique way of obtaining images. They focus a beam of electrons over the surface of the sample, generating highly detailed three-dimensional images of the specimen's surface topography.
- SEMs offer high resolution and depth of field, making them perfect for studying surface details of a sample.
- They are used extensively in geology, archaeology, and nanotechnology to explore the texture and composition of materials.
Yet, similar to TEMs, these microscopes are quite expensive, necessitating elaborate sample preparations, which can be both time-consuming and complex. Like TEMs, SEMs cannot be used with living specimens, as their examination methods would destroy the organisms.